Oda and Assistant Professor Khanh presented their researches at IEEE SAS
03/14/2017
Oda and Assistant Professor Khanh presented their researches at IEEE Sensors Applications Symposium (SAS)
Title
Experimental Demonstration of Non-Destructive Detection of IGBT Fault Positions by Magnetic Sensor
Analysis of VLSI Power Supply Network based on Current Estimation through Magnetic Field Measurement