Japanese version is here.

Research interests

My study is on Low-Power and Hi-Speed VLSI. Especially I am concerning an optimization of global interconnections. We had stdied about Capacitance model, Delay model, and Inductive phenomena (noize, skin effect). Recently, we are concerning noises on Power net in VLSI.

Research RESULTs of Tetsuhisa MIDO

Tetsuhisa MIDO and Kunihiro ASADA,

``Crosstalk Noise Considering Inductive Coupling in VLSI Interconnections in Heterogeneous Insulators,''

Technical Report of IEICE, VLD95-76, Vol.95, No.232, pp.69-74, Sep., 1995.

Tetsuhisa MIDO and Kunihiro ASADA,

``Evaluation on Crosstalk Noise Considering Inductive Coupling in Microstrip Lines in Heterogeneous Insulators,''

JIPC Workshop, Jan., 1996.

Tetsuhisa MIDO and Kunihiro ASADA,

``Simulation of VLSI Interconnections Considering Inductive Coupling Crosstalk Noise,''

The 43rd JSAP Spring Meeting, 26p-H-11, p1339, Mar., 1996.

Tetsuhisa MIDO and Kunihiro ASADA,

``Formulation for Three Dimensional Capacitances of Contiguous Interconnections in VLSI,''

1996 IEICE Fall Conference, C-470, p.131, Sep., 1996.

Kunihiro ASADA and Tetsuhisa MIDO,

``Optimum Aspect Ratio of Cross Section of VLSI Interconnections Considering RC-Delay,''

1996 IEICE Fall Conference, C-471, p.131, Sep., 1996.

Tetsuhisa MIDO and Kunihiro ASADA,

``New Capacitance Formulation and Delay Optimum Aspect Ratio for VLSI Interconnections,''

Technical Report of IEICE, VLD96-49, Vol.96, No.259, pp.55-60, Sep., 1996.

Tetsuhisa Mido and Kunihiro ASADA,

``Accurate Capacitance Formulas for VLSI Interconnections based on Finite Element Analysis,''

Proceedings of ANSYS'96 Conference in japan, pp.239-245, Oct., 1996.

Tetsuhisa MIDO and Kunihiro ASADA,

``Delay Model for Microstrip Lines Considering Skin Effect for Over 1GHz Operation,''

JIPC 8th Workshop, Nov., 1996.

Tetsuhisa Mido and Kunihiro Asada,

``Crosstalk Noise in High Density and High Speed Interconnections due to Inductive Coupling,''

Proceeding of ASP-DAC'97 pp.215-220, Jan., 1997. PAPER , ABSTRUCT

Tetsuhisa MIDO and Kunihiro ASADA,

``Bus Data Coding with Low Coupled Signal for Low Power VLSI,''

Technical Report of IEICE, VLD96-108, Vol.96, No.556, pp.91-96, Mar., 1997.

Tetsuhisa MIDO and Kunihiro ASADA,

``An Analisys on Hi-Frequency VLSI Interconnections Considering Skin Effect,''

The 44th JSAP Spring Meeting, 28p-B-4, p1351, Mar., 1997.

Tetsuhisa MIDO and Kunihiro ASADA,

''An Analysis of Current Distribution in Finite Width Interconnection in Hi-Frequency Integrated System,''

Technical Report of JIPC, CAE97-1, June, 1997.

Tetsuhisa MIDO, Hiroshi ITO and Kunihiro ASADA,

``Test Structure for Calculating Capacitance Matrix of Multi Conductors in VLSI,''

1997 IEICE Fall Conference, C-12-5, p.88, Sep., 1997.

Tetushisa Mido and Kunihiro Asada,

``Delay-Optimum Aspect Ratio of VLSI Interconnections based on New Accurate Capacitance Formulations,''

Proc. of European Conference on Circuit Theory and Design '97, Vol.2, pp.978-983, Sep., 1997. ABSTRUCT

Tetsuhisa MIDO, Minoru AOYAGI and Kunihiro ASADA,

``An Analysis on Hi-Frequency Interconnections in VLSI COnsidering Skin Effect,''

Technical Report of IEICE, VLD97-69, Vol.97, No.269, pp.73-79, Sep., 1997. ABSTRUCT

Tetsuhisa Mido and Kunihiro Asada,

``An Analysis on Hi-Frequency VLSI Interconnection Considering Skin Effect,''

Proceeding of ASP-DAC'98 pp.413-417, Feb., 1998, Yokohama. ABSTRUCT

Tetsuhisa Mido, Hiroshi Ito and Kunihiro Asada,

``TEST Structure for Characterizing Capacitance Matrix of Multi-layer Interconnections in VLSI,''

Proceeding of International Conference on Microelectronic Test Structures (ICMTS), pp.217-222, Mar., 1998, Kanazawa. BEST PAPER..ABSTRUCT

Tetsuhisa MIDO and Kunihiro ASADA,

``An Evaluation of Skin Effect on Hi-Frequency VLSI Interconnections using Numerical Simulation,''

The 45th JSAP Spring Meeting, 28p-L-8, p11, Mar., 1998.

Tetsuhisa MIDO, Hiroshi ITO and Kunihiro ASADA,

``Test Structure for Direct Extraction of Capacitance Matrix in VLSI,''

1998 IEICE Fall Conference, C-12-1, p.92, Sep., 1998.

Tetsuhisa MIDO and Kunihiro ASADA,

``An Analysis on Hi-Frequency Interconnections in VLSI Considering Skin Effect,''

Technical Report of IEICE,} VLD98-84, Vol.98, No.269, pp.89-94, Oct., 1998.ABSTRUCT

Tetsuhisa Mido, Hiroshi Ito and Kunihiro Asada,

``TEST Structure for Characterizing Capacitance Matrix of Multi-layer Interconnections in VLSI,''

IEICE Trans., Electronics, Special Issue on International Conference on Microelectronic Test Structures, April, 1999 (to be published).ABSTRUCT

Tetsuhisa Mido and Kunihiro Asada,

``An Analysis on Hi-Frequenacy Interconnection in VLSI Considering Inductive Effects,''

Proceedings of International Workshop on Timing Issues In the Specification and Synthesis of Digital Systems (TAU'99), pp.173-178, Mar., 1999. ABSTRUCT

Tetsuhisa Mido, Hiroshi Ito and Kunihiro Asada,

``TEST Structure for Direct Extraction of Capacitance Matrix in VLSI,''

Proceeding of International Conference on Microelectronic Test Structures (ICMTS), pp.200-205, Mar., 1999. ABSTRUCT

Tetsuhisa MIDO,s homepage

Members of ASADA Lab.

Asada Lab. HOME page

ASADA LAB. Home Page / Dept. of Electronics Eng., Fac. of Eng., The Univ. of Tokyo. /